Description
Regress Pro is scientific/industrial software that can be used to study experimental data coming from spectroscopic ellipsometers or reflectometers.
Regress Pro has been developed mainly for the application of thin film measurement in the semiconductor industry.
The software is suitable both to determine the thickness of the layers and to determine the optical properties of dielectric materials.
User Reviews for Regress Pro FOR LINUX 1
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for Regress Pro FOR LINUX
Regres Pro for Linux is a powerful tool for analyzing experimental data from ellipsometers. Ideal for semiconductor industry thin film measurement.