MAUD is a free, open-source, cross-platform application, developed at the University of Trento, with the aim of analyzing diffraction data using the combined Rietveld method, which is extended to other types of analyses, using diffraction and spectroscopic techniques.

The program’s features include diffraction, reflectivity, and X-ray fluorescence as techniques, and it can analyze a sample’s crystal structure, crystallographic texture, microstructure, residual stresses, macro stresses, phase quantities, and chemical composition.

MAUD is Java-based, running in a Java Virtual Machine, which makes it compatible with all major desktop platforms. The interface features a relatively simple design, with convenient buttons for importing data, tweaking parameters, and running an analysis.

After loading a data file, you can load and modify phases, configure visible parameters, and use the built-in wizard to refine the spectrum. The plot scale can be customized to focus on a specific area, and you can easily switch between the different graphic representations.

Since this is a scientific application, some background knowledge is necessary, but the controls are relatively easy to figure out. What’s more, there is detailed documentation available on the project’s website that can guide you through the steps of importing and analyzing data.